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Electron Microscopy Laboratory

Our Electron Microscopes

All electron microscopes in the facility are manufactured by Hitachi.

Download overview of our electron microscopes.

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  • nanoDUE’T double beam microscope – NB5000

    Download information on the NB5000

    nb5000 electron microscope at Clemson University, Clemson South Carolin

    Ion beam – Ga ions
    Energy – 40 kV & 60-100 nA
    Resolution – 5 nm @ 40 kV

    E beam – Schotkey diode
    Energy – 30 kV variable current
    Resolution – 1 nm @ 30 kV

    Features

    1. Provides ultra-high-resolution FE SEM.
    2. Exceptional ion milling stability and high performance
    3. Automated mill-and-monitor operations for 3D reconstructions
    4. Slicing steps less than 10 nm.
    5. Dual optics mode with magnetic-field-free live imaging during FIB milling.
    6. Analytical Capabilities :  EDS, EBSD  
    Applications:
    Nanolithography
    TEM Sample Prep
    Sample manipulation
    Surface treatment
    3D Microscopy
    Ion imaging
    Ion-induced SE imaging
  • High-resolution TEM – H9500

    Download information on the H9500

    High-resolution TEM - H9500 electronic microscope, Clemson University, Clemson South Carolina

    Source – LaB6
    Resolution – 0.1 nm at 300 kV
    Best resolution at Clemson University
    Magnification – X 2,000,000

    Applications:
    Inorganic and
    polymeric materials.
    Monitoring crystal lattice
    Diffraction analysis

  • Scanning Transmission Electron Microscope – HD2000

    Download information on the HD2000

    Scanning Transmission Electron Microscope – HD2000 electron microscope, Clemson University, Clemson South Carolina

    Source – Field Emission
    Resolution – 0.24 nm at 200 kV
    Magnification – X 2,000,000

    • Fast sample throughput 20 to 30 times faster than TEM
    • Chemical analysis with EDS
    • Ideally suited for industrial applications where faster sample throughput and TEM resolution is required.

    Energy Dispersive Spectroscopy (EDS)
    Spot/Linescan/Mapping 0.8nm/0.5nm/0.3nm

    Scanning Transmission Electron Microscope – HD2000

  • Transmission Electron Microscope – H7600

    Download information on the H7600

    Transmission Electron Microscope – H7600 electron microscpoe at Clemson University, Clemson South Carolina

    120 kV TEM
    Imaging Range: 50x - 600000X
    High-Resolution Lattice Observation >0.204nm @ 120 kV
    Sample Tilt – +60 to -60 deg
    Biological samples, Light Polymers, Nanoparticles, nano-Catalysts

    Transmission Electron Microscope – H7600 image

  • High Resolution Scanning Electron Microscope – S4800

    Download information on the S4800

    High Resolution Scanning Electron Microscope – S4800 electron microscope Clemson University, Clemson Souyh Carolina

    Resolution – 1 nm @ 30 kV, 1.4 nm @ 1 kV
    Source – Field Emission
    Analysis capability – EDS

    Magnification up to 300K
    STEM capability
    Best for biological / materials samples
    Great resolution at low kV
    Chemical and structure analysis

    High Resolution Scanning Electron Microscope – S4800 image  

  • Variable Pressure Scanning Electron Microscope –SU6600

    Download information on the SU6600

    Variable Pressure Scanning Electron Microscope: SU6600 eletron microscope Clemson University, Clemson South Carolina

    Resolution – 1 nm @ 30 kV
    Source – Schottky (FE)

    Designed for high resolution work at variable pressure
    No need to coat conducting layer
    Magnification up to 300K
    STEM capability

    Variable Pressure Scanning Electron Microscope –SU6600 image  

  • Variable Pressure Scanning Electron Microscope – S3400

    Download information on the S3400

    Variable Pressure Scanning Electron Microscope – S3400 Electron Microscope, Clemson University, Clemson South Carolina

    Source – Tungsten filament
    Resolution – 3 nm @ 30 kV , 10 nm @ 3 kV, 4 nm @ 30 kV (BSE)

    Applications:
    Charge free sample surface
    No need to coat conducting layer
    Magnification up to 300K
    Chemical and structure analysis

    Variable Pressure Scanning Electron Microscope – S3400 image

  • Sample Prep Tools

    Sample prep tools at the Electron Microscope Lab at Clemson Univesrity, Clemson South Carolina Download information on Sample Prep Tools
    • Table top SEM with EDS capability
    • Sputter Coaters
    • Cryo-microtome
    • Sample cutting and polishing
    • Microtome
    • Polishers

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